Description
AISI M-2 Tool Steel Certified Reference Material (CRM)
This M2 certified reference material is a tool steel alloy widely used as a standard for calibrating and verifying your spectrometer (XRF, ICP-OES, Spark-OES, etc.). This material is precisely manufactured and certified to have traceable measurements and specified impurity levels, ensuring reliable results for laboratories performing calibration, quality control, and materials testing.
Certified M2 Chemical Composition:
Element | Composition |
Fe | Balance |
Al | 0.014% |
As | 0.008% |
C | 0.853% |
Co | 0.28% |
Cr | 4.23% |
Cu | 0.098% |
Mn | 0.337% |
Mo | 4.92% |
N | 0.0148% |
Nb | 0.021% |
Ni | 0.182% |
O | 0.0016% |
P | 0.025% |
S | 0.0010% |
Si | 0.26% |
Sn | 0.007% |
Ti | 0.0016% |
V | 1.90% |
W | 5.81% |
M2 Industry Chemical Range:
Element | Composition |
Fe | Balance |
C | 0.78-1.05% |
Mn | 0.15-0.40% |
Si | 0.20-0.45% |
Cr | 0.20-0.45% |
Ni | 0.3% max |
Mo | 4.5-5.5% |
W | 5.5-6.75% |
V | 1.75-2.20% |
Cu | 0.25% max |
P | 0.030% max |
S | 0.030% max |
Other Names:
UNS T11302, AISI M2, AFNOR 06-05-04-02, DIN 1.3343, UNI KU, JIS SKH9, SS 2722, B.S. BM 2, FED QQ-T-590, ASTM A597 CM-2, ASTM A600, SAE J437, SAE J438, UNS T11302
Available material forms:
- XRF: 1/8" thick disc, 1.5" diameter
- OES: 3/4" thick disc, 1.5" diameter
- Chips: 100g of chips
Reference Material (RM):
A reference material, or RM, is a material with a known grade and/or chemical composition that is typically used for alloy or grade identification.
Certified Reference Material (CRM):
A certified reference material, or CRM, is a material that has been thoroughly analyzed and characterized using multiple validated methods to determine its chemical composition. The results of these analyses are then used to establish certified values, along with associated uncertainties. CRMs are produced and certified by accredited organizations or laboratories following internationally recognized standards, such as ISO Guide 34 (ISO 17034).
Please Contact Us if you would like to know the specific dimensions of a sample.